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[求助]
幫我改編一句話啊，換種表達(dá)
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這句話是介紹測試方法的，這句話我在已經(jīng)投的文章里用過了 現(xiàn)在在寫另外的一篇文章，為了避免抄襲 想改編一些，但句子的意思不變 謝謝 To detect the composition and chemical states at the interface, the interfacial layer has to be within the XPS detectable sampling depth R =3λsinα,[11] where λ and α are inelastic mean-free paths (IMFPs) for photoelectrons and a takeoff angle for photoelectrons with respect to the samples surface plane, respectively. The IMFPs can be obtained by using the table compiled by Tanuma et al.[12] For an Al Kα radiation source, the IMFPs for Fe 2p in Fe, for Ni 2p in Ni and for Mg 1s in Mg are 1.34, 1.07 and 0.81 nm, respectively. |
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| in order to determine the composition and chemical states of the interface, the depth of the interfacial layer has to be within the XPS detectable limitation R =3λsinα,[11] where λ is the inelastic mean-free paths (IMFPs) of (for) photoelectrons and α is the takeoff angle of photoelectrons respect to the sample's surface plane. The IMFPs can be calculated according to the reports of Tanuma et al.[12] In the case that the Al Kα is used as the radiation source, the IMFPs for Fe 2p in Fe, Ni 2p in Ni and Mg 1s in Mg are 1.34, 1.07 and 0.81 nm, respectively. |
5樓2013-05-10 11:23:10
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