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京公網(wǎng)安備 11010802022153號
Accession number:
20161302144977
Title: Gene backup number selection method for embryonics cell
Authors: Zhu, Sai1 Email author szhumail@163.com; Cai, Jinyan1 Email author radarc@126.com; Meng, Yafeng1 Email author radarm@126.com; Pan, Gang1
Author affiliation: 1 Department of Electronic and Optical Engineering, Ordnance Engineering College, Shijiazhuang, China
Corresponding author: Meng, Yafeng (radarm@126.com)
Source title: Beijing Hangkong Hangtian Daxue Xuebao/Journal of Beijing University of Aeronautics and Astronautics
Abbreviated source title: Beijing Hangkong Hangtian Daxue Xuebao
Volume: 42
Issue: 2
Issue date: February 1, 2016
Publication year: 2016
Pages: 328-336
Language: Chinese
ISSN: 10015965
CODEN: BHHDE8
Document type: Journal article (JA)
Publisher: Beijing University of Aeronautics and Astronautics (BUAA)
Abstract: The existing structures of embryonics cell's genome memory were analyzed, and a reliability model was developed considering the effect of the gene backup number on self-repair process. The hardware overhead model was built depending on the implementations of genome memories. Based on the reliability model and hardware overhead model, the relationship among reliability, hardware overhead and gene backup number was analyzed, and a gene backup number selection method was proposed. The genome memory structure, gene backup number and the size of embryonics array, taking into account the system reliability and hardware overhead, can be selected with the proposed method, according to the design requirement of reliability and hardware overhead of target circuit. So the proposed method can be introduced to the engineering application. At last, the method is verified through a circuit's gene backup number selection. © 2016, Beijing University of Aeronautics and Astronautics (BUAA). All right reserved.
Number of references: 17
Main heading: Genes
Controlled terms: Hardware - Reconfigurable hardware - Reliability - Repair
Uncontrolled terms: Embryonics - Engineering applications - Existing structure - Hardware overheads - Reliability model - Selection methods - Self repair - System reliability
Classification code: 461.2 Biological Materials and Tissue Engineering - 605 Small Tools and Hardware - 721.3 Computer Circuits - 913.5 Maintenance
DOI: 10.13700/j.bh.1001-5965.2015.0122
Database: Compendex
Compilation and indexing terms, © 2016 Elsevier Inc.
Accession number:
20153201157655
Title: Partial-DNA cyclic memory for bio-inspired electronic cell
Authors: Zhu, Sai1 Email author szhumail@163.com; Cai, Jin-yan1 Email author radarc@126.com; Meng, Ya-feng1 Email author radarm@126.com
Author affiliation: 1 Department of Electronic and Optical Engineering, Mechanical Engineering College, Shijiazhuang, China
Corresponding author: Zhu, Sai (szhumail@163.com)
Source title: Genetic Programming and Evolvable Machines
Abbreviated source title: Genet. Program. Evolvable Mach.
Volume: 17
Issue: 2
Issue date: June 1, 2016
Publication year: 2016
Pages: 83-117
Language: English
ISSN: 13892576
Document type: Journal article (JA)
Publisher: Springer New York LLC
Abstract: Genome memory is an important aspect of electronic cells. Here, a novel genome memory structure called partial-DNA cyclic memory is proposed, in which cells only store a portion of the system’s entire DNA. The stored gene number is independent of the scale of embryonic array and of the target circuit, and can be set according to actual demand in the design process. Genes can be transferred in the cell and the embryonics array through intracellular and intercellular gene cyclic and non-cyclic shifts, and based on this process the embryonic array’s functional differentiation and self-repair can be achieved. In particular, lost genes caused by faulty cells can be recovered through gene updating based on the remaining normal neighbor cells during the self-repair process. A reliability model of the proposed memory structure is built considering the gene updating method, and depending on the implementations of the memory, the hardware overhead is modeled. Based on the reliability model and hardware overhead model, we can find that the memory can achieve high reliability with relatively few gene backups and with low hardware overhead. Theoretical analysis and a simulation experiment show that the new genome memory structure not only achieves functional differentiation and self-repair of the embryonics array, but also ensures system reliability while reducing hardware overhead. This has significant value in engineering applications, allowing the proposed genome memory structure to be used to design larger scale self-repair chips. © 2015, Springer Science+Business Media New York.
Number of references: 27
Main heading: Genes
Controlled terms: DNA - Hardware - Reliability - Reliability analysis - Repair - Structural design
Uncontrolled terms: Embryonics - Engineering applications - Hardware overheads - Memory structure - Reliability model - Self repair - System reliability - Updating methods
DOI: 10.1007/s10710-015-9248-2
Database: Compendex
Compilation and indexing terms, © 2016 Elsevier Inc,
Partial-DNA cyclic memory for bio-inspired electronic cell
作者:Zhu, S (Zhu, Sai)[ 1 ] ; Cai, JY (Cai, Jin-yan)[ 1 ] ; Meng, YF (Meng, Ya-feng)[ 1 ]
GENETIC PROGRAMMING AND EVOLVABLE MACHINES
卷: 17 期: 2 頁: 83-117
DOI: 10.1007/s10710-015-9248-2
出版年: JUN 2016
查看期刊信息
摘要
Genome memory is an important aspect of electronic cells. Here, a novel genome memory structure called partial-DNA cyclic memory is proposed, in which cells only store a portion of the system's entire DNA. The stored gene number is independent of the scale of embryonic array and of the target circuit, and can be set according to actual demand in the design process. Genes can be transferred in the cell and the embryonics array through intracellular and intercellular gene cyclic and non-cyclic shifts, and based on this process the embryonic array's functional differentiation and self-repair can be achieved. In particular, lost genes caused by faulty cells can be recovered through gene updating based on the remaining normal neighbor cells during the self-repair process. A reliability model of the proposed memory structure is built considering the gene updating method, and depending on the implementations of the memory, the hardware overhead is modeled. Based on the reliability model and hardware overhead model, we can find that the memory can achieve high reliability with relatively few gene backups and with low hardware overhead. Theoretical analysis and a simulation experiment show that the new genome memory structure not only achieves functional differentiation and self-repair of the embryonics array, but also ensures system reliability while reducing hardware overhead. This has significant value in engineering applications, allowing the proposed genome memory structure to be used to design larger scale self-repair chips.
關(guān)鍵詞
作者關(guān)鍵詞:Embryonics; Genome memory; Gene shift; Reliability; Self-repair
KeyWords PlusOETIC TISSUE; SYSTEMS; RECONFIGURATION; ARCHITECTURE; RECOVERY
作者信息
通訊作者地址: Zhu, S (通訊作者)
Mech Engn Coll, Dept Elect & Opt Engn, Shijiazhuang, Peoples R China.
地址:
[ 1 ] Mech Engn Coll, Dept Elect & Opt Engn, Shijiazhuang, Peoples R China
電子郵件地址:szhumail@163.com; radarc@126.com; radarm@126.com
基金資助致謝
基金資助機構(gòu) 授權(quán)號
National Natural Science Foundation of China
61271153
61372039
查看基金資助信息
出版商
SPRINGER, 233 SPRING ST, NEW YORK, NY 10013 USA
類別 / 分類
研究方向:Computer Science
Web of Science 類別:Computer Science, Artificial Intelligence; Computer Science, Theory & Methods
文獻信息
文獻類型:Article
語種:English
入藏號: WOS:000376876700001
ISSN: 1389-2576
eISSN: 1573-7632
其他信息
IDS 號: DN2EK
Web of Science 核心合集中的 "引用的參考文獻": 27
Web of Science 核心合集中的 "被引頻次": 0
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