Structure Determination by X-ray Crystallography(Fifth Edition)
X射線晶體學結構測定（第五版）

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Author：Mark Ladd, Rex Palmer



Structure Determination by X-ray Crystallography has been received with acclaim by teachers, researchers and students of crystallography throughout the world since its first edition in 1977. The fifth edition is fully updated, and builds on past successes by presenting up-to-the-minute information on a variety of new topics.
X射線結晶學結構測定自1977年第一版以來，受到了全世界結晶學教師、研究人員和學生的一致好評。在第五版中，新的成功信息會被更新。

The new material includes sections on fullerenes and icosahedral, black and white, and colour symmetry; modern methods of data collection and measurement; new treatment on bioinformatics and energy minimization; extensive revisions and updates on macromolecular crystallography to parallel advances in the field; a new chapter on neutron diffraction and neutron facilities; mathematical appendices and tailored computer programs presented as web material; many new problems with checked solutions; and numerous references and web site addresses of crystallographic importance.
新材料包括富勒烯和二十面體、黑白和顏色對稱的部分；數(shù)據(jù)收集和測量的現(xiàn)代方法；生物信息學和能量最小化的新處理方法；大分子晶體學的廣泛修訂和更新，以在該領域取得平行進展；中子衍射的新篇章和中子設施；數(shù)學附錄和定制的計算機程序作為網(wǎng)絡材料呈現(xiàn)；許多新的問題與檢查的解決方案；和大量的參考文獻和網(wǎng)站地址的結晶學重要性。

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