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[資源]
【資源】2010年新書《Scanning Probe Microscopy in Nanoscience and Nanotechnology?
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Scanning Probe Microscopy in Nanoscience and Nanotechnology NanoScience and Technology ISSN 1434-4904 ISBN 978-3-642-03534-0 e-ISBN 978-3-642-03535-7 DOI 10.1007/978-3-642-03535-7 Springer Heidelberg Dordrecht London New York Nature is the best example of a system functioning on the nanometer scale, where the materials involved, energy consumption, and data handling are opti- mized. Opening the doors to the nanoworld, the emergence of the scanning tunneling microscope in 1982 and the atomic force microscope in 1986 led to a shift of paradigm in the understanding and perception of matter at its most fundamental level. As a consequence, new revolutionary concepts stimulated a number of new technologies. The current volume Scanning Probe Methods in Nanoscience and Nanotechnology shows that these methods are still making a tremendous impact on many disciplines that range from fundamental physics and chemistry through information technology, spintronics, quantum comput- ing, and molecular electronics, all the way to life sciences. Indeed, over 6,000 AFM-related papers were published in 2008 alone, bringing the total to more than 70,000 since its invention, according to the web of science, and the STM has inspired a total of 20,000 papers. There are also more than 500 patents related to the various forms of scanning probe microscopes. Commercializa- tion of the technology started at the end of the 1980s, and approximately 12,000 commercial systems have been sold so far to customers in areas as diverse as fundamental research, the car industry, and even the fashion indus- try. There are also a significant number of home-built systems in operation. Some 60–80 companies are involved in manufacturing SPM and related instru- ments. Indeed, not even the sky seems to be the limit for AFM technology. The Rosetta mission to comet 67P launched by the European Space Agency in 2004 includes an AFM in its MIDAS (Micro-Imaging Dust Analysis System) instrument. The goal of this mission, which is expected to touch down on 67P in 2014, is to analyze particle size distributions in comet material. NASA’s Phoenix mission to Mars in 2008 included an AFM for similar studies (col- laboration between the Universities of Neuchˆ atel and Basel, as well as with Nanosurf GmbH). What does the future hold? Nanotechnology is still dominated to a cer- tain extent by the top down approach where miniaturization plays a crucial role. However, there is a worldwide effort to meet the bottom-up approach ofVI Foreword self-assembly and self-organization that has been so successfully implemented in the natural world. Researchers are trying to unravel nature’s secrets on a nanometer scale to create a new generation of materials, devices, and systems that will spectacularly outperform those we have today in information tech- nology, medicine and biology, environmental technologies, the energy industry, and beyond. As we understand better how nature is doing ‘things’ on a fun- damental level, achievements such as clean chemistry or clean processing will emerge along with the ability to handle waste problems and not polluting the environment. New smart materials, hybrid or heterostructured, as well as carbon nanotubes, a variety of nanowires or graphene could be ingredients for novel energy-saving devices. In order to understand the whole functionality of a cell, Systems Biology Institutes have been established with the hope of arti- ficially synthesizing a cell in a bottom-up approach. Nanomedicine, including non-invasive diagnostics, will be more and more on the agenda, fighting dis- eases on the molecular level, e.g. new kinds of drug delivery systems based on peptides or block co-polymer nanocontainers are being investigated as possible carriers to target carcinogenic cells. Biology is driven by chemistry; however, the scaffold, the gears, the nuts and bolts, e.g. in cell membranes, is nanome- chanics, a template that nature has orchestrated during eons of evolution, and worthwhile trying to copy and implement in novel nanodevices. However, to keep this worldwide effort alive, the interdisciplinary struc- ture of nanoscience requires a new breed of scientists educated in all science disciplines with no language barriers, ready to make an impact on all the global challenges ahead where nanotechnology can be applied1. Scanning Probe Microscopy and related methods will still play an important role in many of these investigations, helping as to capitalize on this fundamental knowledge, beneficial for future technologies and to mankind. Basel, Christoph Gerber August 2009 1 Dynamic Force Microscopy and Spectroscopy Using the Frequency-Modulation Technique in Air and Liquids Hendrik H¨ olscher, Daniel Ebeling, Jan-Erik Schmutz, Marcus M. Sch¨ afer, and Boris Anczykowski ............................... 3 1.1 Introduction............................................... 3 1.2 BasicPrinciplesof theFMTechnique......................... 4 1.2.1 TheEquationofMotion.............................. 4 1.2.2 Oscillation Behavior of a Self-Driven Cantilever . . . . . . . . . 6 1.2.3 Theory of FM Mode Including Tip–Sample Forces . . . . . . . 7 1.2.4 Measuring the Tip–Sample Interaction Force . . . . . . . . . . . . 9 1.2.5 Experimental Comparison of the FM Mode with the Conventional Amplitude-Modulation-mode inAir.............................................. 11 1.3 Mapping of the Tip–Sample Interactions on DPPC MonolayersinAmbientConditions ........................... 12 1.4 Force Spectroscopy of Single Dextran Monomers in Liquid . . . . . . 15 1.5 Summary ................................................. 18 References ..................................................... 19 2 Photonic Force Microscopy: From Femtonewton Force Sensing to Ultra-Sensitive Spectroscopy O.M. Marag`o, P.G. Gucciardi, and P.H. Jones ..................... 23 2.1 Introduction............................................... 24 2.2 PrinciplesofOpticalTrapping............................... 24 2.2.1 TheoreticalBackground.............................. 24 2.3 ExperimentalImplementation ............................... 29 2.3.1 Optical Tweezers Set-up. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29 2.3.2 BrownianMotionandForceSensing ................... 31 2.3.3 Optical Trapping of Linear Nanostructures . . . . . . . . . . . . . 33 2.4 PhotonicForceMicroscopy.................................. 39 2.4.1 Bio-Nano-Imaging................................... 39 2.4.2 Bio-ForceSensingat theNanoscale .................... 42 2.5 Raman Tweezers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45 2.5.1 TheRamanEffect................................... 45 2.5.2 ExperimentalConfiguration........................... 46 2.5.3 Applications ........................................ 48 2.6 Conclusions ............................................... 53 References ..................................................... 53 3 Polarization-Sensitive Tip-Enhanced Raman Scattering Pietro Giuseppe Gucciardi, Marc Lamy de La Chapel le, Jean-Christophe Valmalette, Gennaro Picardi, and Razvigor Ossikovski 57 3.1 Introduction............................................... 57 3.2 Tip-EnhancedRamanSpectroscopy .......................... 58 3.2.1 ConceptandAdvantages ............................. 58 3.2.2 Experimental Implementations of TERS with Side IlluminationOptics.................................. 60 3.2.3 Probes for Tip-Enhanced Raman Spectroscopy . . . . . . . . . . 61 3.3 PolarizedRamanScatteringfromCubicCrystals............... 64 3.3.1 Model for Backscattering Raman Emission in c-Silicon . . . 64 3.3.2 SelectionRules...................................... 67 3.4 Tip-EnhancedFieldModeling ............................... 67 3.4.1 PhenomenologicalModel ............................. 67 3.4.2 NumericalModelsandResults ........................ 70 3.5 Depolarization of Light Scattered by Metallic Tips . . . . . . . . . . . . . 73 3.6 Polarized Tip-Enhanced Raman Spectroscopy of Silicon Crystals . 75 3.6.1 Background Suppression . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 75 3.6.2 Selective Enhancement of the Raman Modes InducedbyDepolarization............................ 80 3.6.3 Evaluationof theFieldEnhancementFactor ............ 84 3.7 Conclusions ............................................... 85 References ..................................................... 86 4 Electrostatic Force Microscopy and Kelvin Force Microscopy as a Probe of the Electrostatic and Electronic Properties of Carbon Nanotubes Thierry M´ elin, Mariusz Zdrojek, and David Brunel .................. 89 4.1 Introduction............................................... 89 4.2 Electrostatic Measurements at the Nanometer Scale . . . . . . . . . . . . 90 4.2.1 ElectrostaticForceMicroscopy........................ 90 4.2.2 KelvinForceMicroscopy ............................. 93 4.2.3 LateralResolutioninEFMandKFM.................. 94 》》》》》》》》》》》》》》》》》 http://d.namipan.com/d/500244c129ff59484b6e90a86b634e4ba8592091205edb01 |
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