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[求助]
第一次投Electronics letter,被拒有審稿意見,求救大俠
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小弟本科生,研究納米材料場發(fā)射,跟導(dǎo)師投了一篇論文到Electronics letter,一個(gè)月被拒,有審稿意見(如下),聽說這個(gè)letter退稿很少給意見。 求助各位不知道按審稿意見修改后,再投是否有戲;蛘咿D(zhuǎn)投其他?求助!求助! The paper is clearly expressed, the principles are sound and the Letter shows a way of reducing damage by transient current. However, in the simulation plot of Fig. 2(b), the experimental rate of decay of current from the maxima at A and B appears much greater than the simulated value. This may be because the capacitance C used in simulation is larger than the experimental value. If the simulated C is reduced to obtain closer agreement, the value of the Letter will be increased. Also in Fig. 3(b), there is qualitative agreement of the transients but the low-frequency response is not well simulated. The reason for this is not easy to see because no values have been reported for Re and Rsource, but possibly Rsource should be larger in the simulation. The authors are invited to repeat the simulations with different C and Rsource, and either to show closer agreement or to suggest reasons why Fig. 3(b) simulation does not agree well with experiment. |
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