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keyousha銅蟲 (初入文壇)
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[求助]
金幣不夠,哪位大哥哥大姐姐好心人白富美高帥富給俺翻一個(gè)東西啊,好人一生平安啊
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摘 要 電子顯微學(xué)和電子顯微鏡技術(shù)對科學(xué)技術(shù)和社會生產(chǎn)力的發(fā)展起著巨大的推動(dòng)作用,這一點(diǎn)已經(jīng)得到了全球科技界的廣泛承認(rèn),高分辨透射電子顯微已經(jīng)成為測試精度最高的納米尺度測量工具。本文主要介紹了高分辨電子顯微學(xué)的發(fā)展及電子顯微圖像分析方法的比較研究,對于高分辨透射電子顯微圖像的算法大體上可以分為兩類:一種是實(shí)空間檢測峰值強(qiáng)度的峰值點(diǎn)對算法,還有就是傅里葉空間的幾何相位方法。在本文中,我們介紹了一種實(shí)空間處理方法,峰值點(diǎn)對算法,它是基于檢測在基準(zhǔn)面上一對強(qiáng)度極大值的仿射變化。盡管這是一種實(shí)空間算法,但峰值點(diǎn)對算法很適用于一些帶有缺陷的部位。因此,這種方法適合在實(shí)空間獲得應(yīng)變場映射繪圖。幾何相位分析法是一種基于透射電子顯微鏡的高精度納米尺度實(shí)驗(yàn)力學(xué)分析方法,它的測量靈敏度可達(dá)到原子水平。通過兩種不同方法的比較,可以對電子顯微圖像分析方法有進(jìn)一步的了解。我們認(rèn)為這兩種算法,在應(yīng)變測定方面是很有用的,兩種方法都有各自不同的優(yōu)點(diǎn)和不足,在對電子顯微圖像分析過程中,它們應(yīng)該被視為兩種互補(bǔ)的工具。 關(guān)鍵詞:高分辨透射電子顯微鏡;圖像處理;幾何相位法 |

木蟲 (小有名氣)

木蟲 (小有名氣)
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Abstract Electron microscopy and electron microscopy techniques of science and technology and the development of social productivity plays a huge role in promoting, it has been widely recognized by the global scientific community, the high-resolution transmission electron microscopy has become the highest test accuracy of nano-scale measurement tools. In this paper, the comparative study of the development of high-resolution electron microscopy and electronic microscopy image analysis methods for high-resolution transmission electron microscopy image of the algorithm in general can be divided into two categories: one is to detect the peak strength of the real space the peak point of the geometric phase of the algorithm, there is the Fourier space. In this paper, we introduce a real space approach, the peak point of the algorithm, which is the affine change based on the detection of the intensity maxima of the datum. Although this is a real-space algorithm, but the peak point of the algorithm is applicable to some defective parts. Therefore, this method is suitable for the strain field mapping graphics in real space. Geometric phase analysis is an analytical method based on transmission electron microscopy, high-precision nanoscale experimental mechanics, the measurement sensitivity can be achieved at the atomic level. By comparing the two different methods, can have a better understanding of electron microscopy image analysis methods. We believe that these two algorithms, and is useful in the determination of strain, both methods have their own different strengths and weaknesses in the process of electron microscopy image analysis, they should be regarded as two complementary tools. Key words: high-resolution transmission electron microscopy; image processing; geometric phase method感覺紅啊的話,就送朵花吧。不用給金幣。嘿嘿 |

銅蟲 (初入文壇)

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