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半導體的native oxide問題
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| 半導體產(chǎn)業(yè)中,Si的一大優(yōu)勢就是它很容易得到native oxide作為insulating layer, 實現(xiàn)mos結(jié)構(gòu), 那么第二代半導體GaAs呢,有的資料中提到它沒有native oxide,但在有的文章中卻默認為會產(chǎn)生native oxide而進行研究和解釋。 所以實際情況是什么樣的呢? 常見的半導體中,哪些有native oxide,哪些沒有native oxide呢? 摻雜以后對這一性質(zhì)有影響嗎?比如InGaAs,AlGaAs? ZnO或摻雜的ZnO會有類似的性質(zhì)以產(chǎn)生insulating layer嗎? |
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看來會有Ga的氧化和As的氧化行為存在,但在常溫空氣條件下,氧化行為會產(chǎn)生足以被認為是insulating layer的效果嗎? In order to know more about the surface state of GaAs(100) epitaxial wafer during a storage period of two years, the XPS analysis was carried out four times on the surface, respectively polished by chemical etching, stored in desiccator for half a year, one year and two years. The results indicated that even after cleaned by proper etchant solutions, the fresh surface was slightly oxidized with Ga2O3, As2O3 and organic contaminant. The epi-wafer was always exposed to air during the storage period, so more and more oxides turned out. The mixed oxide layer comprised of C-OR, COOR, Ga2O3, As2O3 and As2O5 appeared after only half a year. In the ageing process of two years, the oxide types of gallium or arsenic did not change with stable content of Ga2O3 and remarkably fluctuating relative contents of As2O3 and As2O5. Proc. SPIE 8912, International Symposium on Photoelectronic Detection and Imaging 2013: Low-Light-Level Technology and Applications, 89120N (August 16, 2013); doi:10.1117/12.2033679 |
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