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[資源]
SEM鼻祖Roland_Wiesendanger經(jīng)典之作Scanning_Probe_Microscopy_and_Spectroscopy
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Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded with the invention of the scanning tunneling microscope in 1981. Many scanning probe microscopes can image several interactions simultaneously. The manner of using these interactions to obtain an image is generally called a mode. The resolution varies somewhat from technique to technique, but some probe techniques reach a rather impressive atomic resolution. They owe this largely to the ability of piezoelectric actuators to execute motions with a precision and accuracy at the atomic level or better on electronic command. One could rightly call this family of techniques "piezoelectric techniques". The other common denominator is that the data are typically obtained as a two-dimensional grid of data points, visualized in false color as a computer image. The investigation and manipulation of matter on the atomic scale have been revolutionized by scanning tunneling microscopy and related scanning probe techniques. This book provides a clear and comprehensive introduction to the field, describing in detail the basic principles and applications of scanning probe microscopy and spectroscopy. The book consists of two parts. The first deals with the theoretical background of scanning tunneling microscopy, and discusses in detail the design and instrumentation of practical STM systems. Part one concludes with a discussion of the experimental methods employed in scanning force microscopy and other related scanning probe techniques. In part two, the importance and widespread use of local probe techniques are highlighted by a thorough description of their applications in fields such as condensed matter physics, chemistry, biology, and nanotechnology. Containing 350 illustrations, and over 1200 references, this unique book represents an ideal introduction to the subject for final-year undergraduates in physics or materials science. It will also be invaluable to graduate students and researchers in any branch of science where scanning probe techniques are used. |
【儀器分析】資源 | 專業(yè)書籍(外文版)WM | 專業(yè)電子書 | 電化學電源、電源管理 |
化工 | 化學、化工與藥學 | 下載 | 淘貼集 |
透射電子顯微鏡 | 經(jīng)典與現(xiàn)代物理學 | MEMS與傳統(tǒng)機械 | 納米生物學 |
Nanomatershow | 分析技術 | 技術 | jiashu |





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