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[資源]
表面反射電子顯微鏡和能譜分析（英文版）
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王中林教授編：Reflection Electron Microscopy and Spectroscopy for Surface Analysis，分享給大家學(xué)習(xí)交流 內(nèi)容簡(jiǎn)介： In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy-loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature and an ideal guide for graduate students and scientists working on quantitative surface structure characterizations using reflected electron techniques. 目錄： Preface page xiii Symbols and definitions xiv 0 Introduction 1 0.1 Historical background 4 0.2 The scope of the book 6 1 Kinematical electron diffraction 9 1.1 Electron wavelength 9 1.2 Plane wave representation of an incident electron 10 1.3 The Born approximation and single-atom scattering 11 1.4 The Fourier transform 12 1.5 The scattering factor and the charge density function 13 1.6 Single-scattering theory 15 1.7 Reciprocal space and the reciprocal-lattice vector 19 1.8 Bragg's law and the Ewald sphere 20 1.9 Abbe's imaging theory 23 1.10 The phase object approximation 26 1.11 Aberration and the contrast transfer function 27 Part A Diffraction of reflected electrons 29 2 Reflection high-energy electron diffraction 31 2.1 The geometry of RHEED 31 2.2 Surface crystallography 35 2.2.1 Surface reconstruction 36 2.2.2 Two-dimensional reciprocal space 40 2.3 Streaks and Laue rings in RHEED 41 2.4 Determination of surface structures 42 2.5 RHEED oscillation and its application in MBE crystal growth 46 2.6 The kinematical diffraction theory of RHEED 51 2.6.1 Perfectly ordered surfaces 51 2.6.2 Completely disordered surfaces 52 2.6.3 Surfaces with islands 52 2.6.4 Stepped surfaces 53 2.6.5 Surfaces with randomly distributed coverage 54 2.7 Kikuchi patterns in RHEED 55 3 Dynamical theories of RHEED 60 3.1 The Bloch wave theory 62 3.2 Parallel-to-surface multislice theories I 68 3.3 Parallel-to-surface multislice theories II 73 3.4 Perpendicular-to-surface multislice theory 78 3.4.1 Multislice solution of the Schrodinger equation for transmission electron diffraction 80 3.4.2 Applications in RHEED calculations 82 3.5 Diffraction of disordered and stepped surfaces 85 3.5.1 A perturbation theory 85 3.5.2 Stepped surfaces 87 4 Resonance reflections in RHEED 89 4.1 The phenomenon 89 4.2 The resonance parabola and the resonance condition 93 4.3 The width of the resonance parabola 95 4.4 The Kikuchi envelope 99 4.5 Dynamical calculations of resonance scattering 102 4.5.1 Low-incidence-angle resonance 104 4.5.2 High-incidence-angle resonance 107 4.5.3 Resonance at a stepped surface 109 4.5.4 A steady state wave at a surface 116 4.6 The effect of valence excitation in resonance reflection 118 4.6.1 A simplified theory 118 4.6.2 The effect on surface resonance 120 4.7 Enhancement of inelastic scattering signals under the resonance condition 126 Part B Imaging of reflected electrons 129 5 Imaging surfaces in TEM 131 5.1 Techniques for studying surfaces in TEM 131 5.1.1 Imaging using surface-layer reflections 131 5.1.2 Surface profile imaging 134 5.1.3 REM of bulk crystal surfaces 134 5.2 Surface preparation techniques 137 5.2.1 Natural or as-grown surfaces 138 5.2.2 Re-crystallization from melting 139 5.2.3 Annealing polished surfaces 139 5.2.4 Cleaving bulk crystals 140 5.3 Experimental techniques of REM 141 5.3.1 Mounting specimens 141 5.3.2 Microscope pre-alignment 142 5.3.3 Forming REM images 143 5.3.4 Diffraction conditions for REM imaging 145 5.3.5 Image recording techniques 148 …………………… 12 Novel techniques associated with reflection electron imaging 337 12.1 Scanning reflection electron microscopy 337 12.1.1 Imaging surface steps 337 12.1.2 Imaging dislocations 341 12.2 Secondary electron imaging of surfaces 341 12.3 EDS in RHEED geometry 346 12.4 Electron holography of surfaces 346 12.4.1 Principles and theory 347 12.4.2 Surface holography 349 12.5 REMwithSTM 352 12.5.1 Atomic-resolution surface imaging 353 12.5.2 Artifacts in STM imaging 354 12.6 Time-resolved REM and REM with PEEM 355 12.7 Total-reflection X-ray spectroscopy in RHEED 356 12.8 Surface wave excitation Auger electron spectroscopy 361 12.9 LEED and LEEM 363 Appendix A Physical constants, electron wavelengths and wave numbers 367 Appendix B The crystal inner potential and electron scattering factor 369 Appendix C.I Crystallographic structure systems 374 Appendix C.2 A FORTRAN program for calculating crystallographic data 378 Appendix D Electron diffraction patterns of several types of crystal structures 382 Appendix E.I A FORTRAN program for single-loss spectra of a thin crystal slab in TEM 386 Appendix E.2 A FORTRAN program for single-loss REELS spectra in RHEED 390 Appendix E.3 A FORTRAN program for single-loss spectra of parallel-to-surface incident beams 393 Appendix E.4 A FORTRAN program for single-loss spectra of interface excitation in TEM 398 Appendix F A bibliography of REM, SREM and REELS 403 References 419 Materials index 431 Subject index 433 |
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