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求助:Microtexture determination and its applications (Second edition)
Microtexture determination and its applications (Second edition)
Author:V Randle
The characterisation of microstructure is a cornerstone in the study of both natural and technological materials. In the widest sense this topic encompasses for all phases present: morphology, including size and shape distributions; chemical composition; and crystallographic parameters, including orientation and orientation relationships. A landmark advance for the materials community occurred with the genesis of 'microtexture', which for the first time provided integration of crystallographic parameters and other aspects of the microstructure. Microtexture can be defined as 'a population of crystallographic orientations whose individual components are linked to their location within the microstructure'.
The term microtexture can also be applied to any experimental technique used to determine this information. Essentially, atomic planes in the sampled volume of specimen diffract a stationary beam of electrons. Analysis of the resulting diffraction pattern provides crystallographic information which can be related back to its position of origin. An estimated 95% of microtexture determination is by electron backscatter diffraction (EBSD) in a scanning electron microscope (SEM), with the remaining 5% contributed mainly by transmission electron microscopy (TEM) counterparts to EBSD. Evaluation determination is by electron backscatter diffraction (EBSD) in a scanning electron microscope (SEM), with the remaining 5% contributed mainly by transmission electron microscopy (TEM) counterparts to EBSD. Evaluation (indexing) of EBSD diffraction patterns and output of data in a variety of formats is in most cases fully automated. The most exciting EBSD output is an 'orientation map', which is a quantitative depiction of the microstructure in terms of its orientation constituents.
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