求助各位能人。
小弟最近看到一篇文獻(xiàn)是關(guān)于CeO2在玻璃體中的檢測(cè)。
里面給了這么一個(gè)圖
XRD patterns gave direct evidence of CeO2 nanocrystals in RTT glasses, whereas no diffraction peaks could be detected in non-RTT samples with less than 5 mol% Ce (cf. the 1% case in Figure 4(就是我上傳的這張圖)). Raman spectra cannot give directly the value of the CeO2 cluster dimensions, but need calibration through XRD or TEM analysis. By use of the full widths at half-height of the CeO2 X-ray diffraction peaks, analyzed through the Scherrer equation, the mean crystalline size was determined
in the glasses containing 1, 2, 3, and 5 mol % Ce after RTT, obtaining values in the 15-20 nm range (Figure 5(上傳的第二張圖)).A calibration on well-crystallized CeO2 was
taken into account. The error bars in Figure 5 correspond to deviations between results from different Bragg peaks in the CeO2 XRD pattern. In the case of the 5% sample before RTT, very broad peaks appeared corresponding to a crystal size of about 5 nm.
這里面說(shuō)根據(jù)在CeO2的XRD中不同布拉格峰來(lái)確定的誤差。首先對(duì)于布拉格峰小弟就不是很明白是什么東西。在網(wǎng)上查了一下也說(shuō)得不清不楚的。第二,如果我要弄清楚這個(gè)誤差到底是怎么計(jì)算的是不是還要去找CeO2在XRD里面的不同的布拉格峰,這個(gè)要怎么找?求教大師。

(Fig. 4)

Fig. 5 |