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【求助】急!XPS(X射線光電子能譜分析)怎么制樣?
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XPS(X射線光電子能譜分析)怎么制樣?是不是能測元素,如P,N,S ,Cr等。 若想測出這些元素有沒有其他測試手段? 我的樣是在納米球表面包裹了一層聚合物,我測了EDS,P和Cr測不出來 |
XPS專區(qū) |
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XPS只能測樣品深度達(dá) 50-70 Angstroms。不知LZ你的包裹層有多厚,是否可測到里面。 XPS,EDS 一般都是表面分析的。若你想測是否含某些元素,我覺得可用元素分析吧, 原子吸收類的應(yīng)該也可以 X-ray Photoelectron Spectroscopy (XPS), also known as Electron Spectroscopy for Chemical Analysis (ESCA), is used to determine quantitative atomic composition and chemistry. It is a surface analysis technique with a sampling volume that extends from the surface to a depth of approximately 50-70 Angstroms. Alternatively, XPS can be utilized for sputter depth profiling to characterize thin films by quantifying matrix-level elements as a function of depth. XPS is an elemental analysis technique that is unique in providing chemical state information of the detected elements, such as distinguishing between sulfate and sulfide forms of the element sulfur. The process works by irradiating a sample with monochromatic x-rays, resulting in the emission of photoelectrons whose energies are characteristic of the elements within the sampling volume. |
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