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[資源]
在SEM和TEM中的原位微米和納米壓縮試驗(yàn)(In-situ Micro- and Nano-Compression)
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The recent development of the micro- and nano-compression testing inside SEM and TEM on miniaturized samples with diameter varying from 100 nm to 50 um allows for a direct assessment of mechanical properties at such size scale. Original work on nickel [1] micro-pillars and gold nano-pillars [2] has clearly demonstrated that single crystalline metallic micro- and nano-structures considerably outperform their macroscopic counterparts in strength. Following these pioneering works, a wide range of single-crystalline metallic micro-pillars has been investigated[3-7]. The thorough review by Uchic et al. [8] detailed the experimental and numerical study of the micro-compression behavior of mostly micron sized FCC pillars, while a recent review by Greer et al. [9] provides a broader perspective by including studies on other materials system and sub-micron sized specimens. Both the FCC and BCC metals display a power-law like strengthening in micron and sub-micron scale, however, the associated physical mechanisms are distinct from one another. With extensive experimental and computational work, this phenomenon has been explained based on ddislocation-based mechanisms. For the FCC metals, dislocation starvation, followed by the surface nucleation, is responsible for the superior strength; while for the BCC metals, the relative mobility of screw- vs. edge-components of dislocations leads to multiplication and dislocation debris formation, which contributes to such high strength [4-9]. [1] M. D. Uchic et al., Science, 305 (2004) 986. [2] J. R. Greer et al., Acta Mater. 53 (2005) 1821. [3] D. M. Dimiduk et al., Acta Mater., 53 (2005) 4065. [4] A M Minor et al., Nature Mater. 5 (2006) 697. [5] Z. W. Shan et al., Nat Mater., 7 (2007) 115. [6] H Bei et al., Acta Mater., 56 (2008) 4762-4770. [7] S. W. lee et al., Acta Mater., 57 (2009) 4404-4415. [8] M. D. Uchic et al., Annu. Rev. Mater. Res., 39 (2009) 361. [9] J. R. Greer and J T M de Hosson. Prog. Mater. Sci., (2011). MD Uchic和JR Greer都是在斯坦福大學(xué)著名教授WD Nix教授指導(dǎo)下拿的博士學(xué)位,他們的原創(chuàng)性結(jié)果激發(fā)了世界各國(guó)研究人員的興趣,不少課題組對(duì)這個(gè)領(lǐng)域進(jìn)行了跟蹤研究。 以上為個(gè)人撰寫的文章引言的部分內(nèi)容。附件中主要就是MD Uchic和JR Greer原創(chuàng)性文章及他們獨(dú)自撰寫的綜述。[ Last edited by bingan727 on 2012-1-5 at 20:37 ] |
表征與測(cè)試分析 | Nano&Micro | nano physics&chem | 基金、科研 |
介孔+微納米材料+DFT計(jì)算+熱門資源 | 新技術(shù) | 科研啊 努力啊 希望有用啊 | 頭疼的SCI |
我所關(guān)注的 | 實(shí)用工具 | EDX及透射掃描分析 |
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